xrd-crystallography-analyzer

XRD Crystallography Analyzer

Purpose

The XRD Crystallography Analyzer skill provides crystallographic characterization of nanomaterials through X-ray diffraction analysis, enabling phase identification, crystallite size determination, and structural refinement.

Capabilities

• Phase identification and Rietveld refinement
• Crystallite size (Scherrer equation)
• Lattice parameter calculation
• Preferred orientation analysis
• In-situ XRD capabilities
• PDF (Pair Distribution Function) analysis

Usage Guidelines

XRD Analysis

1. Phase Identification

   • Match peaks to database entries
   • Identify multiple phases
   • Assess phase purity

2. Crystallite Size

   • Apply Scherrer equation: D = Kl/(B cos theta)
   • Account for instrumental broadening
   • Use Williamson-Hall for strain

3. Structural Refinement

   • Perform Rietveld refinement
   • Extract lattice parameters
   • Quantify phase fractions

Process Integration

• Multi-Modal Nanomaterial Characterization Pipeline
• Structure-Property Correlation Analysis
• Nanoparticle Synthesis Protocol Development

Input Schema

{
  "diffraction_file": "string",
  "analysis_type": "phase_id|crystallite_size|refinement|pdf",
  "wavelength": "number (Angstrom)",
  "expected_phases": ["string"]
}

Output Schema

{
  "phases": [{
    "name": "string",
    "pdf_number": "string",
    "weight_fraction": "number"
  }],
  "crystallite_size": {
    "value": "number (nm)",
    "method": "string"
  },
  "lattice_parameters": {
    "a": "number",
    "b": "number",
    "c": "number",
    "space_group": "string"
  },
  "refinement_quality": {
    "Rwp": "number",
    "chi_squared": "number"
  }
}